Dr. Krywonos is a research scientist at FSI. He received his PhD in Optics from CREOL at the University of Central Florida, where he specialized in optical design and analysis, and developed a new model for the prediction of scattering from surface roughness. His current research interests include remote sensing, space-based optical systems, and thermosphere-ionosphere data analysis and modeling. He is a member of AGU and SPIE.
Areas of Interest:
- Optical Design
- Image Analysis
- Scattering from Surface Roughness
- B.S. Photonics, State University of New York Institute of Technology, 1995
- M.S. Optics, University of Central Florida, 2000
- Ph.D. Optics, University of Central Florida, 2006